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Ferroelectric behavior in nominally relaxor lead lanthanum zirconate titanate thin films prepared by chemical solution deposition on copper foil

机译:通过化学溶液沉积在铜箔上制备的名义弛豫铅锆酸镧锆酸盐薄膜的铁电行为

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摘要

We demonstrate that (Pb0.9La0.1)(Zr0.65Ti0.35)0.975O3 (PLZT) (10/65/35) thin films that have a nominally relaxor composition and that are deposited by chemical solution deposition onto copper foil show polarization hysteresis. Ferroelectric domain switching and a shift in Curie temperature are also observed. This is in contrast to the non-hysteretic behavior of films with identical composition prepared on Pt/SiO2 / Si substrates. This suggests that the mismatch in coefficient of thermal expansion between PLZT and copper induces a compressive strain in the PLZT during cooling after high temperature crystallization under low pO2, and causes an out-of-plane polarization.
机译:我们证明(Pb0.9La0.1)(Zr0.65Ti0.35)0.975O3(PLZT)(10/65/35)薄膜具有名义上的弛豫成分,并且通过化学溶液沉积法沉积到铜箔上,显示出极化磁滞现象。还观察到铁电畴切换和居里温度的变化。这与在Pt / SiO2 / Si衬底上制备的具有相同成分的薄膜的非滞后行为相反。这表明PLZT和铜之间的热膨胀系数不匹配会在低pO2下高温结晶后的冷却过程中在PLZT中引起压缩应变,并引起面外极化。

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